Please find below a list of Used Test (ATE) Automatic Test Equipment for sale by fabsurplus.com .Click on any listed item of Test (ATE) Automatic Test Equipment to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately | |
95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately | |
78639 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | TEST | 01.11.1997 | 1 | as is where is | immediately | |
87652 | Advantest | T5371 | Test system (With a single test head ) | Test | 1 | as is where is | immediately | ||
89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | Spares | 01.05.2005 | 1 | as is where is | immediately | |
94490 | Advantest | T5375 | Automated Test Equipment | TEST | 2 | as is where is | immediately | ||
99379 | ADVANTEST | T5375 | High-Speed Flash Memory tester | TEST | 1 | as is where is | immediately | ||
99380 | ADVANTEST | T5771ES | Automated Test Equipment for laboratory or office use | TEST | 1 | as is where is | immediately | ||
99388 | Advantest | Versatest V4000 | Automated Test Equipment for laboratory or office use | TEST | 01.06.2006 | 1 | as is where is | immediately | |
99389 | Advantest | Versatest V4000 | Automated Test Equipment | TEST | 01.06.2006 | 1 | as is where is | immediately | |
99390 | Advantest | Versatest V4000 | Automated Test Equipment | TEST | 01.06.2006 | 1 | as is where is | immediately | |
100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | |||
103812 | Advantest | T5335P | Automated Test System | test | 1 | as is where is | immediately | ||
106570 | ADVANTEST | T5371 | Memory Tester | TEST | 01.06.2000 | 1 | as is where is | ||
106571 | ADVANTEST | T5371 | Memory Tester | TEST | 01.06.2000 | 1 | as is where is | ||
106572 | ADVANTEST | T5585 | Memory Tester | TEST | 01.06.2001 | 1 | as is where is | ||
106573 | ADVANTEST | T5585 | Memory Tester | TEST | 1 | as is where is | |||
108048 | Advantest | T5371 | Automated test equipment | TEST | 5 | as is where is | |||
108050 | Advantest | T5585 | Automated test equipment | TEST | 1 | as is where is | |||
108057 | Advantest | T5381ES | ATE Tester | TEST | 3 | as is where is | |||
108058 | Advantest | T5585 | ATE Tester | TEST | 1 | as is where is | |||
108549 | ADVANTEST | T5382A1 | Test System | TEST | 1 | as is where is | immediately | ||
108550 | ADVANTEST | T5585 | Test System | 200 mm | 1 | as is where is | immediately | ||
109120 | Advantest | V5000 | Automated Test equipment | TEST | 01.06.2010 | 11 | as is where is | immediately | |
109131 | Advantest | T5585 | Memory Tester | TEST | 1 | as is where is | |||
109132 | Advantest | T5585 | Memory Tester | TEST | 1 | as is where is | |||
109538 | ADVANTEST | 93000 PS1600 | Automated Test Equipment for SOC testing | TEST | 01.02.2020 | 1 | as is where is | immediately | |
109575 | ADVANTEST | T5377 | Automated test Equipment | Test | 01.06.2010 | 6 | as is where is | immediately | |
109576 | ADVANTEST | T5593 | Automated test Equipment | Test | 01.01.2005 | 1 | as is where is | immediately | |
109577 | ADVANTEST | T5585 | Automated test Equipment | Test | 01.06.2001 | 1 | as is where is | immediately | |
111455 | ADVANTEST | T5593 | AUTOMATED TEST EQUIPMENT | TEST | 01.09.2004 | 1 | as is where is | immediately | |
111520 | ADVANTEST | T5585 | Automated test equipment | TEST | 01.06.2004 | 1 | as is where is | ||
112059 | Advantest | T5377 | Memory Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112060 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112061 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112062 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112063 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112064 | Advantest | T5377 | Memory Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112065 | Advantest | T5377 | Memory Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112066 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112067 | Advantest | T5377 | Memory Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112068 | Advantest | T5377 | Memory Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112069 | Advantest | T5377 | Wafer Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112070 | Advantest | T5377 | Wafer Tester | TEST | 01.06.2004 | 1 | as is where is | ||
112071 | Advantest | T5592 | Memory Tester | TEST | 01.06.2002 | 1 | as is where is | ||
112072 | Advantest | T5592 | Memory Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112073 | Advantest | V93000 | SoC Tester | TEST | 01.06.2008 | 1 | as is where is | ||
112074 | Advantest | V93000 | SoC Tester | TEST | 01.06.2011 | 1 | as is where is | ||
112075 | Advantest | V93000 C400E | SoC Tester | TEST | 1 | as is where is | |||
112076 | Advantest | V93000 PS400 | SoC Tester | TEST | 1 | as is where is | |||
113189 | Advantest | T5585 | Automated TEST EQUIPMENT | TEST | 1 | as is where is | |||
113190 | Advantest | T5585 | Automated TEST EQUIPMENT | TEST | 1 | as is where is | |||
108555 | Agilent | 16702A | LOGIC ANALISYS SYSYEM | TEST | 1 | as is where is | immediately | ||
112077 | Agilent | 4073B | Parametric Tester | TEST | 01.06.2005 | 1 | as is where is | ||
108897 | Agilent / Verigy | 4073B | PARAMETRIC TEST SYSTEM | TEST | 01.05.2011 | 1 | as is where is | immediately | |
108899 | Agilent / Verigy | 4073A | PARAMETRIC TEST SYSTEM | TEST | 01.05.2001 | 1 | as is where is | ||
87089 | Credence | Personal Kalos I | Test system | TEST | 01.10.2002 | 1 | as is where is | immediately | |
110616 | HP / Agilent | 4062 | Automated Test equipment | TEST | 1 | as is where is | immediately | ||
86677 | InTest | Test Head | CPIT TEP8 / STFLASH EPROM / 1792 Test Head | Spares | 31.05.2007 | 1 | as is where is | immediately | |
108970 | IsMeca | NX16 | TEST SYSTEM | TEST | 01.06.2011 | 1 | as is where is | immediately | |
109189 | Keysight / Agilent / Hewlett-Packard (HP) | 4073A | Parametric Tester | TEST | 1 | as is where is | |||
109190 | Keysight / Agilent / Hewlett-Packard (HP) | 4073B | Parametric Tester | TEST | 1 | as is where is | |||
111751 | Keysight / Agilent / Hewlett-Packard (HP) | 4073B | Parametric Tester | 300mm | 1 | as is where is | |||
111818 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
111819 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
111820 | LTX Credence | Fusion CX | Mixed Signal Tester | TEST | 1 | as is where is | |||
108028 | MOSAID | M4205 | Memory Tester | TEST | 1 | as is where is | immediately | ||
108767 | MOSAID | MS4155 | Memory Test System | TEST | 1 | as is where is | immediately | ||
108031 | NEXTEST | MAGNUM II EV ICP | Memory Tester | TEST | 01.11.2011 | 1 | as is where is | ||
99382 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | ||
99383 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | ||
109045 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2003 | 1 | as is where is | immediately | |
109046 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2004 | 1 | as is where is | immediately | |
108030 | Nextest Systems Corporation | MAGNUM ICP 1280 | Memory Tester | TEST | 01.05.2010 | 1 | as is where is | immediately | |
108032 | Nextest Systems Corporation | MAGNUM II ICP 1280 | Memory Tester | TEST | 01.04.2010 | 1 | as is where is | immediately | |
108054 | Shibasoku | S230 | Automated test equipment | TEST | 1 | as is where is | |||
71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | ||||
71908 | ST Automation | PTM1 | Flash Memory Tester | Test | 3 | as is where is | immediately | ||
71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 01.05.2008 | 1 | as is where is | immediately | |
78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately | |
78137 | ST Automation | QT200 | Tester System with monitor | test | 1 | as is where is | immediately | ||
78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | test | 31.03.2007 | 1 | as is where is | immediately | |
80177 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80178 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80179 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80180 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80181 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80182 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80183 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately | |
80184 | ST Automation | QT EPR16 DD | Automated Flash Memory Tester System with monitor | TEST | 30.09.2007 | 1 | as is where is | immediately | |
86279 | ST Automation | MT32SX | Flash Memory testing System | TEST | 30.06.2005 | 1 | as is where is | immediately | |
86280 | ST Automation | PT-M1 | Automated Test System | Test | 1 | as is where is | immediately | ||
86670 | ST Automation | QT200 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately | |
93822 | ST Automation | EPR88 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately | |
93865 | ST Automation | QT 200 epr 88 | Flash Memory Testing System | Test | 31.05.2005 | 1 | as is where is | immediately | |
95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately | |
99969 | ST Automation | QT200 | Automated Tester System with monitor | test | 31.05.2005 | 1 | as is where is | immediately | |
101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately | |
102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately | |
84022 | Sun | Ultrasparc 60 | Unix computer from Teradyne J994 | Test | 31.12.1996 | 1 | as is where is | immediately | |
84023 | Sun | Ultrasparc 60 (Hard Disk Drive) | Hard Disk from Unix computer from Teradyne J994 | Test | 01.01.1997 | 1 | as is where is | immediately | |
33413 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | TEST | 01.05.2006 | 1 | as is all rebuilt | immediately | |
33414 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | test | 01.05.2006 | 1 | as is all rebuilt | immediately | |
78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | ||
80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | ||
54232 | Teradyne | J994 | Memory Tester | test | 01.05.2000 | 1 | as is where is | immediately | |
82231 | Teradyne | 961-061-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | ||
82232 | Teradyne | 961-128-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | ||
106752 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 01.06.1998 | 1 | as is where is | ||
106753 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 01.06.2000 | 1 | as is where is | ||
106754 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 1 | as is where is | |||
108213 | TERADYNE | CATALYST | EDS/ TEST | test | 1 | as is where is | |||
108607 | TERADYNE | IP750EX | AUTOMATED TEST EQUIPMENT For CMOS Image Sensor testing | TEST | 01.06.2012 | 1 | as is where is | immediately | |
108912 | Teradyne | UltraFLEX | Automated Test System | TEST | 01.05.2011 | 1 | as is where is | immediately | |
111537 | TERADYNE | MAGNUM 2X GVLC | Automated test equipment | TEST | 01.06.2010 | 2 | as is where is | immediately | |
111538 | TERADYNE | MAGNUM 2X GVLC | Automated test equipment | TEST | 01.06.2010 | 1 | as is where is | ||
112519 | Teradyne | ETS-500 | TEST | TEST | 01.06.2006 | 1 | as is where is | ||
112520 | Teradyne | ETS-500 | Tester | TEST | 01.06.2000 | 1 | as is where is | ||
112521 | Teradyne | ETS-500 | Tester | TEST | 01.06.2003 | 1 | as is where is | ||
112522 | Teradyne | iFLEX | Final Test | TEST | 01.06.2006 | 1 | as is where is | ||
112523 | Teradyne | iFLEX | Final Tester | TEST | 01.06.2006 | 1 | as is where is | ||
112524 | Teradyne | iFLEX | TEST | TEST | 01.06.2005 | 1 | as is where is | ||
112525 | Teradyne | iFLEX | TEST | TEST | 01.06.2006 | 1 | as is where is | ||
112526 | Teradyne | IP750 | Tester | TEST | 01.06.2000 | 1 | as is where is | ||
112527 | Teradyne | IP750 | Tester | TEST | 01.06.2000 | 1 | as is where is | ||
112528 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112529 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112530 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112531 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112532 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112533 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112534 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112535 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112536 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112537 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112538 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112539 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112540 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112541 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112542 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112543 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112544 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112545 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112546 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112547 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112548 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112549 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112550 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112551 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112552 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112553 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112554 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112555 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112556 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112557 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112558 | Teradyne | IP750EMP | Automated Test Equipment | TEST | 1 | as is where is | |||
112559 | Teradyne | IP750EX | Automated Test Equipment | TEST | 01.06.2001 | 1 | as is where is | ||
112560 | Teradyne | IP750S | Automated Test Equipment | TEST | 01.06.2006 | 1 | as is where is | ||
112561 | Teradyne | J750 | Automated Test Equipment | TEST | 01.06.2001 | 1 | as is where is | ||
112562 | Teradyne | Magnum 5 EV | Memory Tester | TEST | 01.06.2018 | 1 | as is where is | immediately | |
112563 | Teradyne | Magnum II ICP | ANALYSIS | TEST | 01.06.2012 | 1 | as is where is | ||
112564 | Teradyne | Magnum SSV | Memory Tester | TEST | 01.06.2005 | 1 | as is where is | ||
112565 | Teradyne | Magnum SSV | Memory Tester | TEST | 1 | as is where is | |||
112566 | Teradyne | UltraFLEX | UFLEX PA Option_U Flex_ASET | TEST | 01.06.2012 | 1 | as is where is | ||
113177 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 01.06.1998 | 1 | as is where is | ||
113178 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 01.06.2000 | 1 | as is where is | ||
113179 | TERADYNE | CATALYST | Automated Test Equipment | 200 mm,300 mm | 1 | as is where is | |||
113186 | Teradyne | TSLH 124 | In-circuit Test System | TEST | 2 | inquire | immediately | ||
112011 | Verigy (Agilent) | V4400 | Flexible Memory Tester For laboratory use | TEST | 4 | as is where is | |||
100692 | Yokogawa | ST6730A | Logic Tester | TEST | 2 | as is where is | |||
102577 | Yokogawa | TS670 | Tester | TEST | 3 | inquire | immediately | ||
106757 | YOKOGAWA | TS6700 | LCD DRIVER TESTER | TEST | 01.06.2003 | 1 | as is where is | ||
108056 | Yokogawa | AL6095 | Automated test equipment | TEST | 1 | as is where is | |||
113184 | YOKOGAWA | YIKC TS6700 | LCD DRIVER TESTER | 200 mm | 01.06.2003 | 1 | as is where is |