Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 76604 | Advantest | TR6846 | Digital Multimeter | Electronics test and measurement | 1 | as is where is | immediately | |
| 108899 | Agilent / Verigy | 4073A | PARAMETRIC TEST SYSTEM | TEST | 01.05.2001 | 1 | as is where is | |
| 83593 | Allen Bradley | Micro-Logix 1200 | PLC Module | 1 | as is where is | immediately | ||
| 109916 | AMAT | Micro Match | Match | SPARES | 1 | inquire | ||
| 83514 | Applied Materials | Opal 7830i Enhanced | CD MEASUREMENT SEM FOR 200 mm / 150 mm wafers | 100 mm to 200 mm | 01.05.1997 | 1 | as is where is | immediately |
| 110670 | Complete | G5.5 | Flat Panel Display Production line | 1300mm x 1500mm | 01.06.2004 | 1021 | as is where is | immediately |
| 110671 | Complete | G6 | Flat Panel Display Production line | 1500mm x 1850mm | 01.06.2006 | 920 | as is where is | immediately |
| 110672 | Complete | G6 | Flat Panel Display Production line | 1500mm x 1850mm | 01.06.2005 | 1 | as is where is | immediately |
| 106200 | EDAX | Eagle 2 | Micro-probe EDX analyser | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
| 110702 | Heidelberg | DWL-200 | Laser Direct-Write Lithography System | Up to 200 mm | 01.06.2007 | 1 | as is where is | immediately |
| 108752 | HITACHI | S7000 | CD SEM | 150 mm | 01.05.1989 | 1 | as is where is | immediately |
| 110781 | Hitachi | S-7840 | High Resolution Imaging and CD-SEM | 150 mm to 200 mm | 01.09.2000 | 1 | inquire | immediately |
| 56141 | Innolas | ILS 700P | Laser Edge Isolation | 156 mm | 01.11.2006 | 1 | as is where is | immediately |
| 108758 | KARL SUSS | MA6 | Mask Aligner | 50-150 mm | 1 | as is all rebuilt | 1 month | |
| 106897 | Karl Suss Micro Tec | MA200 | Mask Aligner with CIC1000 lamp housing -suitable for spare use | 200 mm | 1 | as is where is | immediately | |
| 106915 | Karl Suss Micro Tec | PA-200 | Wafer Prober Station | 01.06.2001 | 1 | as is where is | immediately | |
| 106916 | Karl Suss Micro Tec | PA200 | Wafer Prober Station | 01.06.2006 | 1 | as is where is | immediately | |
| 84076 | KLA | 050-654234-00 | Lamp Micro Line Filament w/ clips | 30.09.1996 | 1 | as is where is | immediately | |
| 108775 | KLA | AlphaStep 300 | Profilometer | 1 | inquire | |||
| 109562 | KLA | 2367 | Brightfield wafer defect inspection system | 200 mm | 01.09.2006 | 1 | as is where is | immediately |
| 110660 | KLA | 7700 | Surfscan wafer particle detection system | 100 - 200 mm | 1 | as is where is | immediately | |
| 108766 | Micro Automation | 2066 | Mask and wafer cleaner | 1 | as is where is | immediately | ||
| 108185 | Micro Vu | Vertex 420 | Precision coordinate measurement system | assembly | 1 | as is where is | ||
| 99398 | Oxford | Micro-etch 300 | Dry Etcher | 1 | as is where is | immediately | ||
| 83615 | PMS | MICRO LPC-210 | MICROLASER PARTICLE COUNTER | MALVERN WR 13 LN | 31.01.1989 | 1 | as is where is | immediately |
| 106868 | Riber ® | MBE 32 | Molecular Beam Epitaxy system for R and D | Laboratory | 01.03.1999 | 1 | as is where is | immediately |
| 83881 | Rorze | BERC-RD023MS | 2P MICRO STEP DRIVER | VF C5622 | 3 | as is where is | immediately | |
| 91574 | RORZE | RSC242 | Wafer Sorter / 4Foup type | 300 mm | 31.05.2002 | 1 | as is where is | immediately |
| 91575 | RORZE | RSC242 | Wafer Sorter / 4Foup type | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
| 71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 01.05.2008 | 1 | as is where is | immediately |
| 78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately |
| 95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately |
| 101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately |
| 102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 79888 | System General | T9600 | Universal Device Programmer | Electronics Test and Measurement | 01.05.2003 | 1 | as is where is | immediately |
| 108878 | TECHNICAL MFG. CORP. | MICRO-g 62-111 | Vibration Isolation Table, 36" X 72"; 1/4"- 20 Holes on 2" Centers | SPARES | 1 | inquire | ||
| 108879 | TECHNICAL MFG. CORP. | MICRO-g 63-463 | Vibration Isolation Table, 48" X 30" | SPARES | 1 | inquire | ||
| 108880 | TECHNICAL MFG. CORP. | MICRO-g 63-661 | Vibration Isolation Table, 47" X 36" | SPARES | 1 | inquire | ||
| 102642 | Unaxis/Balzers | ZH620 Alumina Fill | Fill Sputter Deposition System | 125 mm | 01.05.2000 | 1 | as is where is | immediately |
| 108216 | ZEISS | AXIOTRON | Inspection Micro Scope | 1 | as is where is | |||
| 108217 | ZEISS | AXIOTRON | Inspection Micro Scope | 1 | as is where is | |||
| 108218 | ZEISS | AXIOTRON | High Perfomance Micro Scope | 01.06.2008 | 1 | as is where is |