The following are the items available for sale related to NIKON at SDI fabsurplus.com. To inquire about the NIKON equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of NIKON items.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
109057 | Nikon | NSR-S307E | 193 nm (ArF) excimer exposure system | 300 mm | 1 | as is where is | immediately | ||
106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | ||
109072 | Nikon | NSR-S208D | 248 nm (KrF) excimer exposure system | 300 mm | 01.06.2010 | 1 | as is where is | immediately | |
110610 | NIKON | OptiStation 3 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | ||
110618 | NIKON | Optistation 3 | Wafer Inspection Microscope | 01.07.1994 | 1 | as is where is | immediately | ||
103456 | Nikon | NWL860-TBM | Wafer Auto Loader | 150 mm, 200 mm | 1 | as is where is | immediately | ||
111396 | Nikon | R2205H | Set of test reticles | spares | 4 | as is where is | immediately | ||
108854 | NIKON | NWL-860 | Automatic Microscope Wafer Loader for up to 200mm Wafers | 1 | inquire | ||||
108087 | Nikon | 4S061-690-1 | Linear Motor Controller | spares | 1 | as is where is | |||
108855 | NIKON | Optiphot 200 | Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More | 1 | inquire | ||||
108088 | Nikon | 4S586-580 | NEST | spares | 1 | as is where is | |||
108089 | Nikon | Irradiance Meter | included G-line sensor | spares | 1 | as is where is | |||
108092 | Nikon | OPTIPHOT-200 | Wafer inspection microscope | 200 mm | 3 | as is where is | |||
108093 | Nikon | OPTIPHOT-300 | Wafer inspection microscope | 300 mm | 1 | as is where is | |||
108094 | Nikon | OPTIPHOT-88-AC IN | Wafer inspection microscope | 200 mm | 1 | as is where is | |||
108095 | Nikon | R1505A | test reticle | spares | 2 | as is where is | immediately | ||
111423 | Nikon | 4S065-050-2 | Controller | 1 | as is where is | immediately | |||
108096 | Nikon | R2005MF(VER3.09N), R2005HMF(VER5.09) | test reticle | spares | 2 | as is where is | |||
108097 | Nikon | R2205HA, HB, HDIS, HMF | test reticle | spares | 4 | as is where is | |||
108098 | Nikon | VT286 | Digital | spares | 2 | as is where is | |||
110663 | Nikon | NSR-SF140 | I-LINE SCANNER | 300 mm | 1 | as is where is | immediately | ||
110664 | Nikon | NSR-S204B | 248 nm (KrF) excimer exposure system | 200 mm | 1 | as is where is | immediately | ||
111445 | Nikon | X-tek V130 | PCB X-ray inspection system - Ideal for solder bump inspection | SMT | 01.06.2011 | 1 | as is where is | immediately | |
110690 | Nikon | NSR 2205 I11D | i line Stepper | 200 mm | 01.06.1997 | 1 | as is where is | immediately | |
108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately | |
110691 | Nikon | NSR 2205 I9C | i line Stepper | 200 mm | 01.06.1994 | 1 | as is where is | immediately | |
110695 | Nikon | NWL 860 TMB | Wafer Inspection Microscope with wafer autoloader | 150 mm, 200 mm | 1 | as is where is | immediately | ||
108904 | Nikon | NSR-S609B | ArF 193 nm scanner (Scanner) | 300 mm | 01.05.2005 | 1 | as is where is | immediately | |
108923 | Nikon | NES1-H04 | Mini stepper | 100 mm | 01.05.2011 | 1 | as is where is | immediately | |
112253 | Nikon | NSR-2205EX14C | Stepper 250nm, KrF Stepper with Cymer ELS 5400 laser | 200 mm | 01.06.2000 | 1 | as is where is | ||
112254 | Nikon | NSR-2205EX14C | Stepper 250nm, KrF Stepper | 200 mm | 01.06.2000 | 1 | as is where is | ||
112255 | Nikon | NSR-2205i11D | Stepper 350nm, i-Line Stepper | 200 mm | 01.06.1998 | 1 | as is where is | ||
112256 | Nikon | NSR-2205i11D | Stepper 350nm, i-Line Stepper | 200 mm | 01.06.2000 | 1 | as is where is | ||
112257 | Nikon | NSR-S208D | Scanner 110nm, KrF Scanner | 300 mm | 01.06.2011 | 1 | as is where is | ||
112258 | Nikon | NSR-SF130 | Stepper 280nm, I-Line Stepper | 300 mm | 01.06.2005 | 1 | as is where is | ||
113286 | Nikon | S-207D | Stepper | 01.01.2005 | 1 | as is all rebuilt | immediately | ||
110729 | Nikon | NSR-S204B | Photo-lithography 248 NM DUV Scanner with photo-track | 300 MM | 01.06.2002 | 1 | as is where is | immediately | |
109215 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 1 | as is where is | |||
108965 | Nikon | A1R | Confocal Laser Scanning Microscope with Prior Proscan III automated stage | Laboratory | 1 | as is where is | immediately | ||
18867 | NIKON | 204402 | Operations manual NSR-1755I7A | 1 | as is where is | immediately | |||
98484 | Nikon | ECLIPSE L150 | Microscope | 100/150mm | 1 | as is where is | immediately | ||
98485 | Nikon | Optiphot 150 | Microscope Inspection Station | 100/150mm | 3 | as is where is | immediately | ||
110791 | Nikon | OptiStation 3200 | Fully Automated Wafer Inspection Microscope | 300 mm | 1 | as is where is | immediately | ||
32206 | NIKON | RETICLE BOX 5 INCH | 5 INCH RETICLE BOX | 5 INCH | 2 | as is where is | immediately | ||
106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113111 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113112 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113113 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113114 | NIKON | NEXIV VMZ-R3020 | MICROSCOPE AUTOMATED MEASURING SYSTEMS | 200 mm-300 mm | 1 | as is where is | |||
113115 | NIKON | NSR-S203B | DUV scanner with Cymer ELS-5410 | 200 mm | 01.06.1999 | 1 | as is where is | ||
113116 | NIKON | NSR-S306C | ArF scanner | 200 mm | 1 | as is where is | |||
109278 | Nikon | NSR2205 i14E | i-line stepper | 200 mm | 01.05.2000 | 1 | as is where is | immediately | |
109536 | Nikon | NSR-SF100 | i-line scan-field Stepper | 200 mm | 01.06.2003 | 1 | as is all rebuilt | immediately | |
111843 | Nikon | AMI-3000 | Macro-Defect | 300mm | 1 | as is where is | |||
112867 | Nikon | Eclipse ME600L | Microscope,BF/DF/DIC,Reflected Light | 1 | as is where is | ||||
108772 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.05.1994 | 1 | as is where is | immediately | |
111844 | Nikon | NSR-2005i10C | i-Line Stepper | 200mm | 1 | as is where is | |||
112868 | Nikon | MM-11 | Microscope, Bright & Dark Ref/Trans Light | 1 | as is where is | ||||
111845 | Nikon | NSR-2205i12D | i-Line Stepper | 200mm | 1 | as is where is | |||
112869 | Nikon | MM-11B | Microscope, Ref/Trans Light | 1 | as is where is | ||||
111846 | Nikon | NSR-2205i12D | i-Line Stepper | 200mm | 1 | as is where is | |||
112870 | Nikon | MM-11B | Microscope, Brightfield Ref/Trans Light | 1 | as is where is | ||||
111847 | Nikon | NSR-4425i | i-Line Wide-Field Stepper | 200mm | 1 | as is where is | |||
112871 | Nikon | OPTIPHOT 200 | Microscope, Bright & Dark | 1 | as is where is | ||||
111592 | Nikon | 4S065-535-1 | Linear XY Stage Motor Amplifier | spares | 01.06.2020 | 1 | as is where is | immediately | |
111848 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 9 | as is where is | |||
112872 | Nikon | Optiphot 200 | Microscope,Bright & Dark,Reflected Light | 3 | as is where is | ||||
111849 | Nikon | NSR-SF110 | i-Line Wide-Field Stepper | 300mm | 1 | as is where is | |||
112873 | Nikon | XD-20 | Microscope,BF/DF/DIC/POL,Ref/Trans Light | 1 | as is where is | ||||
111850 | Nikon | V-12A | Optical comparator | N/A | 1 | as is where is | |||
91376 | NIKON | NSR-204B | Scanner DUV (GIGAPHOTON G20K2 KRF laser) | 200 mm | 1 | as is where is | |||
108784 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.05.1997 | 1 | as is where is | immediately | |
111344 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
91377 | NIKON | NSR-204B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.2000 | 1 | as is where is | immediately | |
108785 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | ||
111345 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2011 | 2 | as is where is | immediately | |
108789 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | ||
108790 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately |