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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
109057 | Nikon | NSR-S307E | 193 nm (ArF) excimer exposure system | 300 mm | 1 | as is where is | immediately | ||
106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | ||
109072 | Nikon | NSR-S208D | 248 nm (KrF) excimer exposure system | 300 mm | 01.06.2010 | 1 | as is where is | immediately | |
110610 | NIKON | OptiStation 3 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | ||
110618 | NIKON | Optistation 3 | Wafer Inspection Microscope | 01.07.1994 | 1 | as is where is | immediately | ||
103456 | Nikon | NWL860-TBM | Wafer Auto Loader | 150 mm, 200 mm | 1 | as is where is | immediately | ||
111396 | Nikon | R2205H | Set of test reticles | spares | 4 | as is where is | immediately | ||
108854 | NIKON | NWL-860 | Automatic Microscope Wafer Loader for up to 200mm Wafers | 1 | inquire | ||||
108087 | Nikon | 4S061-690-1 | Linear Motor Controller | spares | 1 | as is where is | immediately | ||
108855 | NIKON | Optiphot 200 | Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More | 1 | inquire | ||||
108088 | Nikon | 4S586-580 | NEST | spares | 1 | as is where is | |||
108089 | Nikon | Irradiance Meter | included G-line sensor | spares | 1 | as is where is | |||
108092 | Nikon | OPTIPHOT-200 | Wafer inspection microscope | 200 mm | 3 | as is where is | |||
108093 | Nikon | OPTIPHOT-300 | Wafer inspection microscope | 300 mm | 1 | as is where is | |||
108094 | Nikon | OPTIPHOT-88-AC IN | Wafer inspection microscope | 200 mm | 1 | as is where is | |||
108095 | Nikon | R1505A | test reticle | spares | 2 | as is where is | immediately | ||
111423 | Nikon | 4S065-050-2 | Controller | 1 | as is where is | immediately | |||
108096 | Nikon | R2005MF(VER3.09N), R2005HMF(VER5.09) | test reticle | spares | 2 | as is where is | |||
108097 | Nikon | R2205HA, HB, HDIS, HMF | test reticle | spares | 4 | as is where is | |||
108098 | Nikon | VT286 | Digital | spares | 2 | as is where is | |||
110663 | Nikon | NSR-SF140 | I-LINE SCANNER | 300 mm | 1 | as is where is | immediately | ||
110664 | Nikon | NSR-S204B | 248 nm (KrF) excimer exposure system | 200 mm | 1 | as is where is | immediately | ||
111445 | Nikon | X-tek V130 | PCB X-ray inspection system - Ideal for solder bump inspection | SMT | 01.06.2011 | 1 | as is where is | immediately | |
110690 | Nikon | NSR 2205 I11D | i line Stepper | 200 mm | 01.06.1997 | 1 | as is where is | immediately | |
108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately | |
110691 | Nikon | NSR 2205 I9C | i line Stepper | 200 mm | 01.06.1994 | 1 | as is where is | immediately | |
110695 | Nikon | NWL 860 TMB | Wafer Inspection Microscope with wafer autoloader | 150 mm, 200 mm | 1 | as is where is | immediately | ||
108904 | Nikon | NSR-S609B | ArF 193 nm scanner (Scanner) | 300 mm | 01.05.2005 | 1 | as is where is | immediately | |
108923 | Nikon | NES1-H04 | Mini stepper | 100 mm | 01.05.2011 | 1 | as is where is | immediately | |
112253 | Nikon | NSR-2205EX14C | Stepper 250nm, KrF Stepper with Cymer ELS 5400 laser | 200 mm | 01.06.2000 | 1 | as is where is | ||
112254 | Nikon | NSR-2205EX14C | Stepper 250nm, KrF Stepper | 200 mm | 01.06.2000 | 1 | as is where is | ||
112255 | Nikon | NSR-2205i11D | Stepper 350nm, i-Line Stepper | 200 mm | 01.06.1998 | 1 | as is where is | ||
112256 | Nikon | NSR-2205i11D | Stepper 350nm, i-Line Stepper | 200 mm | 01.06.2000 | 1 | as is where is | ||
112257 | Nikon | NSR-S208D | Scanner 110nm, KrF Scanner | 300 mm | 01.06.2011 | 1 | as is where is | ||
112258 | Nikon | NSR-SF130 | Stepper 280nm, I-Line Stepper | 300 mm | 01.06.2005 | 1 | as is where is | ||
113286 | Nikon | S-207D | Stepper | 01.01.2005 | 1 | as is all rebuilt | immediately | ||
110729 | Nikon | NSR-S204B | Photo-lithography 248 NM DUV Scanner with photo-track | 300 MM | 01.06.2002 | 1 | as is where is | immediately | |
109215 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 1 | as is where is | |||
108965 | Nikon | A1R | Confocal Laser Scanning Microscope with Prior Proscan III automated stage | Laboratory | 1 | as is where is | immediately | ||
18867 | NIKON | 204402 | Operations manual NSR-1755I7A | 1 | as is where is | immediately | |||
98484 | Nikon | ECLIPSE L150 | Microscope | 100/150mm | 1 | as is where is | immediately | ||
98485 | Nikon | Optiphot 150 | Microscope Inspection Station | 100/150mm | 3 | as is where is | immediately | ||
110791 | Nikon | OptiStation 3200 | Fully Automated Wafer Inspection Microscope | 300 mm | 1 | as is where is | immediately | ||
32206 | NIKON | RETICLE BOX 5 INCH | 5 INCH RETICLE BOX | 5 INCH | 2 | as is where is | immediately | ||
106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113111 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113112 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113113 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | |||
113114 | NIKON | NEXIV VMZ-R3020 | MICROSCOPE AUTOMATED MEASURING SYSTEMS | 200 mm-300 mm | 1 | as is where is | |||
113115 | NIKON | NSR-S203B | DUV scanner with Cymer ELS-5410 | 200 mm | 01.06.1999 | 1 | as is where is | ||
113116 | NIKON | NSR-S306C | ArF scanner | 200 mm | 1 | as is where is | |||
109278 | Nikon | NSR2205 i14E | i-line stepper | 200 mm | 01.05.2000 | 1 | as is where is | immediately | |
109536 | Nikon | NSR-SF100 | i-line scan-field Stepper | 200 mm | 01.06.2003 | 1 | as is all rebuilt | immediately | |
111843 | Nikon | AMI-3000 | Macro-Defect | 300mm | 1 | as is where is | |||
112867 | Nikon | Eclipse ME600L | Microscope,BF/DF/DIC,Reflected Light | 1 | as is where is | ||||
108772 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.05.1994 | 1 | as is where is | immediately | |
111844 | Nikon | NSR-2005i10C | i-Line Stepper | 200mm | 1 | as is where is | |||
112868 | Nikon | MM-11 | Microscope, Bright & Dark Ref/Trans Light | 1 | as is where is | ||||
111845 | Nikon | NSR-2205i12D | i-Line Stepper | 200mm | 1 | as is where is | |||
112869 | Nikon | MM-11B | Microscope, Ref/Trans Light | 1 | as is where is | ||||
111846 | Nikon | NSR-2205i12D | i-Line Stepper | 200mm | 1 | as is where is | |||
112870 | Nikon | MM-11B | Microscope, Brightfield Ref/Trans Light | 1 | as is where is | ||||
111847 | Nikon | NSR-4425i | i-Line Wide-Field Stepper | 200mm | 1 | as is where is | |||
112871 | Nikon | OPTIPHOT 200 | Microscope, Bright & Dark | 1 | as is where is | ||||
111592 | Nikon | 4S065-535-1 | Linear XY Stage Motor Amplifier | spares | 01.06.2020 | 1 | as is where is | immediately | |
111848 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 9 | as is where is | |||
112872 | Nikon | Optiphot 200 | Microscope,Bright & Dark,Reflected Light | 3 | as is where is | ||||
111849 | Nikon | NSR-SF110 | i-Line Wide-Field Stepper | 300mm | 1 | as is where is | |||
112873 | Nikon | XD-20 | Microscope,BF/DF/DIC/POL,Ref/Trans Light | 1 | as is where is | ||||
111850 | Nikon | V-12A | Optical comparator | N/A | 1 | as is where is | |||
91376 | NIKON | NSR-204B | Scanner DUV (GIGAPHOTON G20K2 KRF laser) | 200 mm | 1 | as is where is | |||
108784 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.05.1997 | 1 | as is where is | immediately | |
111344 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2008 | 1 | as is where is | immediately | |
91377 | NIKON | NSR-204B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.2000 | 1 | as is where is | immediately | |
108785 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | ||
111345 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2011 | 2 | as is where is | immediately | |
108789 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | ||
108790 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately |